EmbeddedShield：アクティブシリコンメッシュ、グリッチ検知センサー、耐タンパーマイクロコントローラ

EmbeddedShieldは、RTL IPコア、高次算術マスキングアーキテクチャ、フォールト検出回路を提供し、FIPS 203/204準拠ASICおよびマイコンを差分電力解析（DPA）やクロック／電圧グリッチ攻撃から物理的に防護します。

EmbeddedShield Silicon Architecture & Side-Channel Masking Topology

Higher-order polynomial masking engine, dual-rail pre-charge logic, and optical fault sensor

Central System: Shielded Crypto Engine - Masked Lattice ALU

Cryptographic Nodes

  • Random Mask Generator
  • Masked NTT Multiplier
  • Dual-Rail Asynchronous ALU
  • Photodiode Glitch Sensor
  • Clock Jitter Generator

Architectural Layers & Protocols

  • Differential Logic Plane (Sense-Amplifier-Based Logic (SABL) / Dual-Rail): Ensuring identical power consumption for logic 0 and logic 1 transitions across all clock cycles.
  • Algorithmic Polynomial Masking (First-Order and Second-Order Arithmetic Masking): Splitting lattice coefficients into random shares (x = x_A + x_B mod q) throughout NTT pipelines.
  • Active Physical Fault Sensors (Substrate Light Diodes & Voltage Spike Detectors): Detecting laser fault injection (LFI) and power supply glitching during cryptographic execution.
  • Execution Time Randomization (Randomized Shuffling & Dummy Instruction Insertion): Decorrelating electromagnetic radiation traces from algorithmic execution order.

Key Metrics: Order-2 (Higher-Order Masking Target) | > 5M Traces (DPA Resistance Threshold) | < 1.5 ns (Glitch Detection Latency) | Zero Branch (Fault-Resilient State Machine)

シリコンレベルのDPA故障注入対策、ASIC向けマスク化多項式演算とデュアルレールロジック

Authoritative technical engineering reference for silicon-level dpa fault injection countermeasures, masked polynomial arithmetic for asics & dual-rail logic in NIST FIPS 203/204/205 standards, lattice-based cryptography, side-channel attack mitigation, and quantum-resilient infrastructure.

Core Engineering Areas

Technical Articles

Related Cluster Architecture Specifications